Showing results 1 to 1 of 1
Issue Date | Title | Author(s) |
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- | Medium Range Order in amorphous Ge2Sb2Te5 measured by fluctuation electron microscopy | Min-Ho Kwon; Bong-Sub Lee; Stephanie N. Bogle; John R. Abelson; Stephen G. Bishop; Simone Raoux; Heng Li; P. Craig Taylor |