2012-04 | Effect of Precursor Ratio on the Structural Properties of ZnO Thin Films Deposited by Low Pressure MOCVD | Kang, H. -M.; Jeong, J. -H.; Park, J. -K.; Lee, K. -S.; Kim, W. M.; Choi, H. -J.; Baik, Y. -J. |
2006-12 | Improvement of the thermal and chemical stability of Al doped ZnO films | Kim, I. H.; Ku, D. Y.; Ko, J. H.; Kim, D.; Lee, K. S.; Jeong, J. -H.; Lee, T. S.; Cheong, B.; Baik, Y. -J.; Kim, W. M. |
2016-07 | Nanocolumnar Composite Microstructure of Superhard SiC Thin Film Deposited Using Unbalanced Magnetron Sputtering Method | Bae, K. -E.; Chae, K. -W.; Park, J. -K.; Lee, W. -S.; Baik, Y. -J. |
2006-12-05 | Structural and electrical properties of sputtered indium-zinc oxide thin films | Ku, D. Y.; Kim, I. H.; Lee, I.; Lee, K. S.; Lee, T. S.; Jeon, J. -h.; Cheong, B.; Baik, Y. -J.; Kim, W. M. |
2013-05-25 | The parameter space of hydrogen content added to Ar-nitrogen sputtering gas and substrate bias voltage for the formation of cubic boron nitride thin film deposited by unbalanced magnetron sputtering method | Ko, J. -S.; Park, J. -K.; Lee, W. -S.; Baik, Y. -J. |