Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
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2016-01 | Electronic structure study and dielectric properties of amorphous ZrO2 and HfO2 | Sharma, A.; Varshney, M.; Kang, S.; Baik, J.; Ha, T.-K.; Chae, K.-H.; Kumar, S.; Shin, H.-J. |
2020-08 | Influence of high energy ion irradiation on structural, morphological and optical properties of high-k dielectric hafnium oxide (HfO2) thin films grown by atomic layer deposition | Kumar, Rajesh; Chauhan, Vishnu; Koratkar, N.; Kumar, Shalendra; Sharma, Aditya; Chae, K.-H.; Won, S.O. |