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Showing results 1 to 4 of 4

Issue DateTitleAuthor(s)
-Applications of TOF-SIMS for organic materials in archaeology and forensic sicenceLEE, YEON HEE; Lee Ji-hye; Youngsoo, Kim; Seokchan Choi; Seung Wook Ham; LEE, KANG BONG; Chiwoo Lee; Kang-Jin Kim
-Qualitative analysis of the red stamping inks on paper using TOF-SIMSLee Ji-hye; Chiwoo Lee; LEE, YEON HEE
-Surface analysis of organic dye materials using Time-of-Flight Secondary Ion Mass SpectrometryLee Ji-hye; Chiwoo Lee; LEE, YEON HEE
-TOF-SIMS Study of red sealing-inks on paper and its forensic applicationsLee Ji-hye; Chiwoo Lee; LEE, KANG BONG; LEE, YEON HEE
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