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Issue DateTitleAuthor(s)
2014-03-12Systematic Reliability Study of Top-Gate p- and n-Channel Organic Field-Effect TransistorsHwang, Do Kyung; Fuentes-Hernandez, Canek; Fenoll, Mathieu; Yun, Minseong; Park, Jihoon; Shim, Jae Won; Knauer, Keith A.; Dindar, Arnir; Kim, Hyunichul; Kim, Yongjin; Kim, Jungbae; Cheun, Hyeunseok; Payne, Marcia M.; Graham, Samuel; Im, Seongil; Anthony, John E.; Kippelen, Bernard
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