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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
2006-10Thickness dependence of exchange anisotropy in NiFe/IrMn bilayers studied by Planar Hall EffectThanh, N. T.; Chun, M. G.; Ha, N. D.; Kim, K. Y.; Kim, C. O.; Kim, C. G.
2007-03-01Thickness dependence of parallel and perpendicular anisotropic resistivity in Ta/NiFe/IrMn/Ta multilayer studied by anisotropic magnetoresistance and planar Hall effectThanh, N. T.; Tu, L. T.; Ha, N. D.; Kim, C. O.; Kim, CheolGi; Shin, K. H.; Rao, B. Parvatheeswara
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