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Issue DateTitleAuthor(s)
2025-05Superior QLC Retention Enhancement of a Large Memory Window FEFET Through Gate Stack EngineeringKuk, Song-Hyeon; Kim, Bong Ho; Park, Youngkeun; Ko, Kyul; Hwang, Hyeon-Seong; Cho, Byung Jin; Han, Jae-Hoon; Kim, Sang-Hyeon
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