Showing results 1 to 2 of 2
| Issue Date | Title | Author(s) |
|---|---|---|
| 2025-05 | Proposal of Block Erase and Verify Schemes for Ferroelectric NAND: Overcoming Critical Challenges from Threshold Voltage Polarity | Kuk, Song-Hyeon; Kim, Bong Ho; Park, Youngkeun; Hwang, Hyeon-Seong; Han, Jae-Hoon; Cho, Byung Jin; Jang, Byung Chul; Kim, Sang-Hyeon |
| 2025-07 | Superior QLC Retention Enhancement of a Large Memory Window FEFET Through Gate Stack Engineering | Kuk, Song-Hyeon; Kim, Bong Ho; Park, Youngkeun; Ko, Kyul; Hwang, Hyeon-Seong; Cho, Byung Jin; Han, Jae-Hoon; Kim, Sang-Hyeon |