Showing results 1 to 3 of 3
Issue Date | Title | Author(s) |
---|---|---|
2015-12 | Advanced Methodologies for Manipulating Nanoscale Features in Focused Ion Beam | Yang-Hee Kim; Jong-Hyun Seo; Ji Yeong Lee; Jae-Pyoung Ahn |
2016-01 | Focused Ion Beam-Based Specimen Preparation for Atom Probe Tomography | Ji Yeong Lee; Jae-Pyoung Ahn |
2006-01 | Phase Identification of Nano-Phase Materials using Convergent Beam Electron Diffraction (CBED) Technique | Gyeungho Kim; Jae-Pyoung Ahn |