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Issue DateTitleAuthor(s)
2018-02Flaw-Containing Alumina Hollow Nanostructures Have Ultrahigh Fracture Strength To Be Incorporated into High-Efficiency GaN Light-Emitting DiodesKang, Sung-gyu; Moon, Daeyoung; Jang, Jeonghwan; Kim, Ju-Young; Suh, Jin-Yoo; Yoon, Euijoon; Han, Heung Nam; Choi, In-suk
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