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Showing results 1 to 5 of 5

Issue DateTitleAuthor(s)
2015-10Atom probe tomograpy 정량 분석 연구LEE, JI YEONG; Jang Yun Jung; Yanghee, Kim; Song Jae Bong; LEE, YEON HEE; Ahn, Jae Pyoung
2015-10Atom Probe를 이용한 정량 분석의 신뢰성 연구LEE, JI YEONG; Jang Yun Jung; 송재봉; Yanghee, Kim; LEE, YEON HEE; Ahn, Jae Pyoung
-Comparison of Quantitative Analysis for CIGS Thin Films by TOFSIMS, Magnetic Sector SIMS, and AES김선희; Jang Yun Jung; 윤정현; Jeung-hyun Jeong; LEE, YEON HEE
-Comparison of Quantitative Analysis for Photocoltaic CIGS Thin Films by SIMS Depth Profiling with Element Ions and MCs+ ClustersLEE, YEON HEE; Lee Ji-hye; 김선희; Jang Yun Jung
2013-02표면분석장비를 이용한 CIGS 정량분석김선희; 윤정현; Jang Yun Jung; LEE, YEON HEE
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