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Showing results 1 to 4 of 4

Issue DateTitleAuthor(s)
2023-04Effect of Scandium Insertion Into the Gate-Stack of Ferroelectric Field-Effect TransistorsKim, Bong Ho; Kuk, Song-Hyeon; Kim, Seong Kwang; Kim, Joon Pyo; Suh, Yoon-Je; Jeong, Jaeyong; Geum, Dae-Myeong; Baek, Seung-Hyub; Kim, Sang Hyeon
2021-06Electrical Analysis for Wafer-Bonded Interfaces of p(+)GaAs/n(+)InGaAs and p(+)InGaAs/n(+)InGaAsGeum, Dae-Myeong; Kim, Seong Kwang; Lim, Hyeong-Rak; Park, Juhyuk; Jeong, Jaeyong; Han, Jae Hoon; Choi, Won Jun; Kim, Hyo-Jin; Kim, Sanghyeon
2024-05Heavily Doped Channel Carrier Mobility in β-Ga2O3 Lateral Accumulation MOSFETKuk, Song-Hyeon; Choi, Seongjun; Kim, Hyeong Yun; Ko, Kyul; Jeong, Jaeyong; Geum, Dae-Myeong; Han, Jae-Hoon; Park, Ji-Hyeon; Jeon, Dae-Woo; Kim, Sang-Hyeon
2023-05Oxygen Scavenging in HfZrOx-Based n/p-FeFETs for Switching Voltage Scaling and Endurance/Retention ImprovementKim, Bong Ho; Kuk, Song-Hyeon; Kim, Seong Kwang; Kim, Joon Pyo; Suh, Yoon-Je; Jeong, Jaeyong; Geum, Dae-Myeong; Baek, Seung-Hyub; Kim, Sang Hyeon
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