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Showing results 1 to 4 of 4

Issue DateTitleAuthor(s)
2022-03Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias ApplicationsLee, Kookjin; Ji, Hyunjin; Kim, Yanghee; Kaczer, Ben; Lee, Hyebin; Ahn, Jae-Pyoung; Choi, Junhee; Grill, Alexander; Panarella, Luca; Smets, Quentin; Verreck, Devin; Van Beek, Simon; Chasin, Adrian; Linten, Dimitri; Na, Junhong; Lee, Jae Woo; De Wolf, Ingrid; Kim, Gyu-Tae
2021-04-16Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FETLee, Kookjin; Kim, Yeonsu; Lee, Hyebin; Park, Sojeong; Lee, Yongwoo; Joo, Min-Kyu; Ji, Hyunjin; Lee, Jaewoo; Chun, Jungu; Sung, Moonsoo; Cho, Young-Hoon; Kim, Doyoon; Choi, Junhee; Lee, Jae Woo; Jeon, Dae-Young; Choi, Sung-Jin; Kim, Gyu-Tae
2020-11-06Real-time effect of electron beam on MoS(2)field-effect transistorsLee, Kookjin; Lee, Hyebin; Kim, Yanghee; Choi, Junhee; Ahn, Jae-Pyoung; Shin, Dong Hoon; Cho, Young-Hoon; Jang, Ho-kyun; Lee, Sang Wook; Shin, Jinwoo; Ji, Hyunjin; Kim, Gyu-Tae
2019-12-07Transfer of transition-metal dichalcogenide circuits onto arbitrary substrates for flexible device applicationsLee, Hyebin; Lee, Kookjin; Kim, Yanghee; Ji, Hyunjin; Choi, Junhee; Kim, Minsik; Ahn, Jae-Pyoung; Kim, Gyu-Tae
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