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Showing results 1 to 3 of 3

Issue DateTitleAuthor(s)
2015-12Advanced Methodologies for Manipulating Nanoscale Features in Focused Ion BeamYang-Hee Kim; Jong-Hyun Seo; Ji Yeong Lee; Jae-Pyoung Ahn
2016-01Focused Ion Beam-Based Specimen Preparation for Atom Probe TomographyJi Yeong Lee; Jae-Pyoung Ahn
-Nano-embossed structure on polypropylene induced by low energy Ar ion beam irradiationSk. Faruque Ahmed; Geon Ho Roh; Ji Yeong Lee; Seong Jin Kim; Ho-Young Kim; Yong-Jun Jang; Myoung-Woon Moon; Lee, Kwang Ryeol
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