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Issue DateTitleAuthor(s)
2024-07-04Unveiling the high-temperature degradation mechanism of solid oxide electrolysis cells through direct imaging of nanoscale interfacial phenomenaChang, Hye Jung; Choi, Haneul; Jisu Shin; Changho Yeon; Sun-Young Park; Lee, Jong Ho; Yoon, Kyung Joong; Chan-Woo Lee
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