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Issue Date | Title | Author(s) |
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2024-06 | Grain boundary control for high-reliability HfO 2-based RRAM | Jeong, Dong Geun; Park, Eunpyo; Jo, Yooyeon; Yang, Eunyeong; Noh, Gichang; Lee, Dae Kyu; Kim, Min Jee; Jeong, Yeonjoo; Jang, Hyun Jae; Joe, Daniel J.; Chang, Jiwon; Kwak, Joon Young |