Showing results 1 to 6 of 6
Issue Date | Title | Author(s) |
---|---|---|
2002-02 | Effect of grain boundary energy on surface-energy induced abnormal grain growth in columnar-grained film | Jung, JK; Hwang, NM; PARK, YOUNG JOON; Joo, YC |
2001-05-25 | Electromigration-induced stress interaction between vias and polygranular clusters | Park, YJ; Joo, YC |
2002-02-01 | Electromigration-induced via failure assisted by neighboring clusters | Choi, IS; Park, YJ; Joo, YC |
2002-04 | Impurity redistributions in electroplated Cu films during self-annealing | Yoon, MS; PARK, YOUNG JOON; Joo, YC |
2001-08-13 | Tertiary grain growth driven by surface energy | Jung, JK; Park, YJ; Hwang, NM; Joo, YC |
2005-05 | Three-dimensional simulation of microstructure evolution in damascene interconnects: Effect of overburden thickness | Jung, JK; Hwang, NM; Park, YJ; Joo, YC |