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Issue Date | Title | Author(s) |
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2024-09 | Effect of Source/Drain Electrode Materials on the Electrical Performance and Stability of Amorphous Indium-Tin-Zinc-Oxide FETs | An, Seong Ui; Ahn, Dae-Hwan; Ju, Gijun; Chen, Simin; Ji, Yo Seop; Han, Jae-Hoon; Kim, Jaekyun; Kim, Younghyun |