Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| 2025-12 | Enhanced reliability of HfO2-based conductive bridge random access memory through MgO insertion | Lee, Si-yeol; Kim, Seung-Hwan; Hwang Inkook; Jung, Kwangkyo; Yu, Hyun-Yong; Park, Hamin; Baek, Seung-heon Chris |