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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
-Aptamer sensor by using total internal reflection ellipsometryJung Yong Woo; Woo, Deok Ha; KIM, JAE HUN; Tae Jung Kim; Young Dong Kim
-Development of aptamer sensor by using total internal reflection ellipsometryJung Yong Woo; Lee, Seok; Woo, Deok Ha; KIM, JAE HUN
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