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Showing results 1 to 3 of 3

Issue DateTitleAuthor(s)
2012-03Correlation between the stability and trap parameters of amorphous oxide thin film transistorsChong, Eugene; Park, Ki-Ho; Cho, Eun Ah; Choi, Jun Young; Kim, Bosul; You, Dong-Youn; Jang, Gun-Eik; Lee, Sang Yeol
2011-08-08Origin of threshold voltage shift by interfacial trap density in amorphous InGaZnO thin film transistor under temperature induced stressKim, Bosul; Chong, Eugene; Kim, Do Hyung; Jeon, Yong Woo; Kim, Dae Hwan; Lee, Sang Yeol
2012Reduction of channel resistance in amorphous oxide thin-film transistors with buried layerChong, Eugene; Kim, Bosul; Lee, Sang Yeol
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