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Issue DateTitleAuthor(s)
2026-03Optoelectronic Characterization of Trap Density of States in Indium Gallium Oxide Thin-Film Transistors and Their Impact on Bias StabilityKim, Sang Yeon; Lee, Je-Jun; Hur, Jae Seok; Kim, Buyeon; Hong, Jung Pyo; Han, Seong-Jun; Yeon, Eungseon; Kim, Jung Woo; Jeong, Jae Kyeong; Hwang, Do Kyung
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