Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
---|---|---|
2007-10 | Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders | Choi, Pyuck-Pa; Al-Kassab, Tala'at; Kwon, Young-Soon; Kim, Ji-Soon; Kirchheim, Reiner |
2007-04 | Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique | Choi, Pyuck-Pa; Kwon, Young-Soon; Kim, Ji-Soon; Al-Kassab, Tala'at |