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Showing results 1 to 4 of 4

Issue DateTitleAuthor(s)
2021-11-01Calibration of high magnification in the measurement of critical dimension by AFM and SEMKwak, Gyea Young; Chang, Hye Jung; Na, Min Young; Ryu, Seo Kyoung; Kim, Tae Gun; Woo, Jin Chun; Kim, Kyung Joong
2015-01CCQM pilot study CCQM-P140: quantitative surface analysis of multi-element alloy filmsKim, Kyung Joong; Jang, Jong Shik; Kim, An Soon; Suh, Jung Ki; Chung, Yong-Duck; Hodoroaba, Vasile-Dan; Wirth, Thomas; Unger, Wolfgang; Kang, Hee Jae; Popov, Oleg; Popov, Inna; Kuselman, Ilya; Lee, Yeon Hee; Sykes, David E.; Wang, Meiling; Wang, Hai; Ogiwara, Toshiya; Nishio, Mitsuaki; Tanuma, Shigeo; Simons, David; Szakal, Christopher; Osborn, William; Terauchi, Shinya; Ito, Mika; Kurokawa, Akira; Fujimoto, Toshiyuki; Jordaan, Werner; Jeong, Chil Seong; Havelund, Rasmus; Spencer, Steve; Shard, Alex; Streeck, Cornelia; Beckhoff, Burkhard; Eicke, Axel; Terborg, Ralf
2020-05Comparison of quantitative analyses using SIMS, atom probe tomography, and femtosecond laser ablation inductively coupled plasma mass spectrometry with Si1-XGeX and Fe1-X Ni-X binary alloysJang, Yun Jung; Kim, Seon Hee; Kim, Kyung Joong; Kim, Donghwan; Lee, Yeonhee
2014-11Preface for the Proceedings of SIMS XIX, Jeju, Korea 2013Lee, Yeonhee; Moon, DaeWon; Kang, Hee Jae; Kim, Kyung Joong; Lee, Tae Geol; Lee, Jae Cheol; Yi, Keewook; Hong, Tae Eun
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