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Issue DateTitleAuthor(s)
2009-08-31A study on the temperature dependence of characteristics of phase change memory devicesLee, Suyoun; Jeong, Doo Seok; Jeong, Jeung-hyun; Zhe, Wu; Park, Young-Wook; Ahn, Hyung-Woo; Kim, Mok; Cheong, Byung-ki
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