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Issue DateTitleAuthor(s)
2025-08Comprehensive Understanding of Fatigue, Breakdown, and Recovery Mechanism by Thickness Scaling in Hf0.5Zr0.5O2/Ge MF(I)S Capacitors for Low Writing VoltagesJeong, Jai-Youn; Ko, Kyeol; Shin, Changhwan; Han, Jae-Hoon
1

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