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Issue DateTitleAuthor(s)
2016-10Accurate characterization of mask defects by combination of phase retrieval and deterministic approachLEPORTIER, THIBAULT LOUIS DAVID; Park, Min-Chul; Kim, Wooshik; Song, Jin Dong
2014-07Robust Phase Retrieval Algorithm for Noisy Diffraction Patterns Using Normalized ConvolutionLEPORTIER, THIBAULT LOUIS DAVID; Jhon, Young Min; Park, Min-Chul
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