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Issue DateTitleAuthor(s)
2019-02-15Effects of thermal and electrical stress on defect generation in InAs metal-oxide-semiconductor capacitorBaik, Min; Kang, Hang-Kyu; Kang, Yu-Seon; Jeong, Kwang-Sik; Lee, Changmin; Kim, Hyoungsub; Song, Jin-Dong; Cho, Mann-Ho
1

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