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Issue DateTitleAuthor(s)
2008-04Low-frequency noise characterization of ZnO nanorod back-gate field-effect transistor structureLee, Jungil; Yu, Byung-Yong; Lee, Chul Ho; Yi, Gyu-Chul; Son, Seung Hun; Kim, Gyu-Tae; Ghibaudo, Gerard
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