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Issue DateTitleAuthor(s)
2026-04Correlation among Process, Microstructure/Stoichiometry, and Transport in Spin-Coated Al-Doped ZnO Thin-Film Transistors Subjected to Annealing-Induced Electrical Performance EnhancementLee, Namgyu; Lee, Jaewon; Kim, Hyungu; Lee, Wonki; Hwang, Jun Yeon; Pujar, Pavan; Yoon, Sangmoon; Hong, Seongin
1

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