| 1995-09-15 | DECREASE OF THE NUMBER OF THE ISOLATED EMISSION CENTER MN2+ IN AN AGED ZNS-MN ELECTROLUMINESCENT DEVICE | LEE, YH; KIM, DH; JU, BK; SONG, MH; HAHN, TS; CHOH, SH; OH, MH |
| 1995-02 | EFFECT OF MULTILAYERED SRS-SRS-CE-SRS PHOSPHOR PREPARED BY MULTISOURCE DEPOSITION METHOD ON THE THIN-FILM ELECTROLUMINESCENT DEVICES | LEE, YH; KIM, DH; JU, BK; YEOM, TH; HAHN, TS; OH, MH; CHOH, SH |
| 1994-03 | ELECTRICAL-PROPERTIES OF RADIO-FREQUENCY MAGNETRON-SPUTTERED (BASR)TIO3 THIN-FILMS ON INDIUM TIN OXIDE-COATED GLASS SUBSTRATE | KIM, TS; KIM, CH; OH, MH |
| 1991-12-01 | ELECTRON-PARAMAGNETIC RESONANCE CHARACTERISTICS OF THE MN ACTIVATOR IN A ZNS-MN ELECTROLUMINESCENT DEVICE | LEE, YH; OH, MH; CHOH, SH |
| 1994-02-01 | FABRICATION OF SILICON MEMBRANE USING FUSION BONDING AND 2-STEP ELECTROCHEMICAL ETCH-STOPPING | JU, BK; OH, MH; TCHAH, KH |
| 1993-06 | INFLUENCES OF INDIUM TIN OXIDE LAYER ON THE PROPERTIES OF RF MAGNETRON-SPUTTERED (BASR)TIO3 THIN-FILMS ON INDIUM TIN OXIDE-COATED GLASS SUBSTRATE | KIM, TS; OH, MH; KIM, CH |
| 1993-03-01 | INTERFACIAL OXIDE-GROWTH AND FILLING-UP BEHAVIOR OF THE MICRO-GAP IN SILICON FUSION BONDING PROCESSES | JU, BK; OH, MH; TCHAH, KH |
| 1994-02-01 | LUMINESCENCE AND ELECTRON-PARAMAGNETIC-RESONANCE STUDIES OF WHITE-LIGHT EMITTING SRS-PR,F THIN-FILM ELECTROLUMINESCENT DEVICES | LEE, YH; JU, BK; YEOM, TH; KIM, DH; HAHN, TS; CHOH, SH; OH, MH |
| 1992-11 | MICROSCOPY STUDIES FOR THE DEEP-ANISOTROPIC ETCHING OF (100) SI WAFERS | JU, BK; HA, BJ; KIM, CJ; OH, MH; TCHAH, KH |
| 1995-02 | ON THE ANISOTROPICALLY ETCHED BONDING INTERFACE OF DIRECTLY BONDED (100) SILICON-WAFER PAIRS | JU, BK; LEE, YH; TCHAH, KH; OH, MH |
| 1991-03-04 | POSSIBLE DEGRADATION MECHANISM IN ZNS-MN ALTERNATING-CURRENT THIN-FILM ELECTROLUMINESCENT DISPLAY | LEE, YH; CHUNG, IJ; OH, MH |
| 1994-05 | PREPARATION OF AMORPHOUS BATIO3 THIN-FILMS ON INDIUM TIN OXIDE-COATED SODA LIME GLASS BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION | YOON, YS; LEE, DH; KIM, TS; OH, MH; YOM, SS |
| 1994-10-01 | THE EFFECT OF BUFFER LAYER ON THE STRUCTURAL AND ELECTRICAL-PROPERTIES OF (BASR)TIO3 THIN-FILMS DEPOSITED ON INDIUM TIN OXIDE-COATED GLASS SUBSTRATE BY USING A RF MAGNETRON SPUTTERING METHOD | KIM, TS; KIM, CH; OH, MH |
| 1995-01-01 | THE THICKNESS DEPENDENCE OF (BA0.5SR0.5)TIO3 THIN-FILMS DEPOSITED ON INDIUM TIN OXIDE-COATED GLASS SUBSTRATE USING RF MAGNETRON SPUTTERING | KIM, TS; OH, MH; KIM, CH |
