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Issue DateTitleAuthor(s)
2023-03Highly Reliable Electrochemical Metallization Threshold Switch Through Conductive Filament Engineering Using Two-Dimensional PtSe2 Insertion LayerKim, Min-Su; Park, Euyjin; Kim, Seung-Geun; Park, Jae-Hyeun; Kim, Seung-Hwan; Han, Kyu-Hyun; Yu, Hyun-Yong
1

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