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Issue DateTitleAuthor(s)
2013-02Effects of suboxide layers on the electronic properties of Si(100)/SiO2 interfaces: Atomistic multi-scale approachKim, Byung-Hyun; Kim, Gyubong; Park, Kihoon; Shin, Mincheol; Chung, Yong-Chae; Lee, Kwang-Ryeol
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