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Showing results 1 to 3 of 3

Issue DateTitleAuthor(s)
2025-07Heterogeneous 3-D Sequential CFET With Strain-Engineered Ge (100) Top-Channel pMOSFET on Bulk Si (100) nMOSFETLim, Hyeongrak; Kim, Seong Kwang; Lee, Seung Woo; Park, Youngkeun; Jeong, Jaejoong; Jeong, Hojin; Lim, Jinha; Geum, Dae-Myeong; Han, Jae Hoon; Kim, Younghyun; Jeong, Jaeyong; Cho, Byung Jin; Kim, Sanghyeon
2025-05Proposal of Block Erase and Verify Schemes for Ferroelectric NAND: Overcoming Critical Challenges from Threshold Voltage PolarityKuk, Song-Hyeon; Kim, Bong Ho; Park, Youngkeun; Hwang, Hyeon-Seong; Han, Jae-Hoon; Cho, Byung Jin; Jang, Byung Chul; Kim, Sang-Hyeon
2025-07Superior QLC Retention Enhancement of a Large Memory Window FEFET Through Gate Stack EngineeringKuk, Song-Hyeon; Kim, Bong Ho; Park, Youngkeun; Ko, Kyul; Hwang, Hyeon-Seong; Cho, Byung Jin; Han, Jae-Hoon; Kim, Sang-Hyeon
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