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Issue DateTitleAuthor(s)
2007-01-08Nanometer-scale order in amorphous Ge2Sb2Te5 analyzed by fluctuation electron microscopyKwon, Min-Ho; Lee, Bong-Sub; Bogle, Stephanie N.; Nittala, Lakshmi N.; Bishop, Stephen G.; Abelson, John R.; Raoux, Simone; Cheong, Byung-ki; Kim, Ki-Bum
1

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