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Issue DateTitleAuthor(s)
2022-06Electric-field-resolved near-infrared microscopyMamaikin, Mikhail; Li, Yik-Long; Ridente, Enrico; Chen, Wei Ting; Park, Joon-Suh; Zhu, Alexander Y.; Capasso, Federico; Weidman, Matthew; Schultze, Martin; Krausz, Ferenc; Karpowicz, Nicholas
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