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Issue Date | Title | Author(s) |
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2010-05-31 | High-resolution X-ray photoelectron spectroscopy study of InTe thin film in structural phase transition from amorphous to crystalline phase | Lee, Young Mi; Park, Yongsup; Sun, Chang-Woo; Lee, Jeong Yong; Shin, Hyun Joon; Kim, Yong Tae; Jung, Min-Cherl |