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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
2001-03Mechanisms of formation of phase contrast in tapping mode atomic force microscopyChizhik, SA; Ahn, HS; Suslov, AA; Kovalev, AV; Kim, CH
2002-11Tip-sample deformation in repulsive tapping mode AFM and artifacts in height measurementChizhik, SA; Ahn, HS; Shasholko, DI; Suslov, AA
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