Browsing byAuthorThompson, CV
Showing results 1 to 3 of 3
| Issue Date | Title | Author(s) |
|---|---|---|
| 1999-12-15 | Mechanism maps for electromigration-induced failure of metal and alloy interconnects | Andleigh, VK; Srikar, VT; Park, YJ; Thompson, CV |
| 1999-04-01 | Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnects | Park, YJ; Andleigh, VK; Thompson, CV |
| 1997-11-01 | The effects of the stress dependence of atomic diffusivity on stress evolution due to electromigration | Park, YJ; Thompson, CV |
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