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Issue DateTitleAuthor(s)
1993-03STRUCTURAL AND ELECTRICAL-PROPERTIES OF AL2O3 THIN-FILMS ON P-SI GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL VAPOR-DEPOSITIONKIM, TW; YOM, SS; KANG, WN; YOON, YS; KIM, C; KIM, S; YANG, IS; WEE, YJ
1

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