Browsing byAuthorWon Il Park

Jump to:
All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
  • Sort by:
  • In order:
  • Results/Page
  • Authors/Record:

Showing results 1 to 1 of 1

Issue DateTitleAuthor(s)
-Measuring strength of VLS-grown Si nanowires: AFM bending vs. nanoindentationYong-Jae Kim; Kwangsoo Son; Jeung-hyun Jeong; Won Il Park; Jae-il Jang

BROWSE