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Issue DateTitleAuthor(s)
2025-09The Investigation of Effective Thermal Oxidation to SiC MOSFET Gate Oxide Quality ImprovementYoungbin Im; Inkyu Kim; Jiyeong Yoon; Jingu Lee; Gihoon Park; Jesung Lim; Junewoo Son; Jungho Lee; Yun Jung Jang; Changbeom Jeong
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