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Issue DateTitleAuthor(s)
2011-10-03Stress evolution during the oxidation of silicon nanowires in the sub-10 nm diameter regimeKim, Byung-Hyun; Pamungkas, Mauludi Ariesto; Park, Mina; Kim, Gyubong; Lee, Kwang-Ryeol; Chung, Yong-Chae
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