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Issue Date | Title | Author(s) |
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2000-10-16 | Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs | Hyon, CK; Choi, SC; Song, SH; Hwang, SW; Son, MH; Ahn, D; Park, YJ; Kim, EK |
2000-12 | Effects of a Si molecular beam on the formation of InAs quantum dots | Park, YM; Park, YJ; Kim, KM; Roh, CH; Hyon, CK; Kim, EK; Yoo, KH |
2000-09 | Formation of high quality GaAs epilayers on InP substrates by using a patterned GaAs fusion layer | Hwang, SM; Choi, IH; Park, YJ; Hyon, CK; Kim, EK; Min, SK |
2000-08-07 | Evaluations of strains in fused layers using patterned substrates | Hwang, SM; Lee, JY; Park, SK; Hyon, CK; Kim, Y; Park, YJ; Kim, EK; Choi, IH |
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4
Kim, EK
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4
Park, YJ
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2
Choi, IH
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2
Hwang, SM
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Ahn, D
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Choi, SC
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Hwang, SW
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Kim, KM
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Kim, Y
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Lee, JY