| 2001-06-01 | The effect of ZrO2 buffer layer on electrical properties in Pt/SrBi2Ta2O9/ZrO2/Si ferroelectric gate oxide structure | Choi, HS; Kim, EH; Choi, IH; Kim, YT; Choi, JH; Lee, JY |
| 2001-02 | High-resolution transmission electron microscopy study on the solid-phase crystallization of amorphous SrBi2Ta2O9 thin films on Si | Choi, JH; Lee, JY; Kim, YT |
| 2001-07 | Crystal structure and electrical properties of Pt/SrBi2Ta2O9/ZrO2/Si | Choi, HS; Kim, EH; Choi, IH; Kim, YT; Choi, JH; Lee, JY |
| 2001-07 | Low-temperature crystallization induced by excimer laser irradiation of SrBi2Ta2O9 films | Seol, KS; Hiramatsu, H; Ohki, Y; Choi, IH; Kim, YT |
| 2001-07 | Effects of rapid thermal annealing on the electrical properties of cobalt contact to p-GaN | Kim, JW; Kim, SI; Kim, YT; Kim, S; Sung, MY; Choi, IH |
| 2001-04 | Electrical characteristics of Pt/SrBi2Ta2O9/Ta2O5/Si using Ta2O5 as the buffer layer | Choi, HS; Kim, YT; Kim, SI; Choi, IH |
| 2001-03 | Improvement of the reliability of a Cu/W-N/SiOF multilevel interconnect by inserting plasma enhanced chemical vapor deposited W-N thin film | Kim, DJ; Sim, HS; Lee, S; Kim, YT; Kim, SI; Park, JW |
| 2001-01 | Increased polyamine concentrations in the hair of cancer patients | Choi, MH; Kim, KR; Kim, YT; Chung, BC |
| 2001-12 | Electrical properties of Pt/SrBi2Ta2O9/Ta2O5/Si ferroelectric gate structure | Choi, HS; Park, KS; Hur, JS; Choi, IH; Kim, YT; Kim, SI |
| 2001-11 | Effects of post-annealing on the microstructure and ferroelectric properties of YMnO3 thin films on Si | Yoo, DC; Lee, JY; Kim, IS; Kim, YT |
