KIST Library Institutional Repository

Measuring strength of VLS-grown Si nanowires: AFM bending vs. nanoindentation

Authors

Yong-Jae Kim; Kwangsoo Son; Jeung-hyun Jeong; Won Il Park; Jae-il Jang

Citation

Materials Research Society Spring 2010

URI

https://pubs.kist.re.kr/handle/201004/100187

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML