Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE, YEON HEE | - |
| dc.contributor.author | Lee Ji-hye | - |
| dc.contributor.author | Donghwan Yoon | - |
| dc.contributor.author | Kwanwoo Shin | - |
| dc.date.accessioned | 2024-01-13T01:30:33Z | - |
| dc.date.available | 2024-01-13T01:30:33Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/100856 | - |
| dc.language | English | - |
| dc.title | Depth profiling of lamella phase block copolymer using SIMS | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | 17th International conference on SIMS, v.17 | - |
| dc.citation.title | 17th International conference on SIMS | - |
| dc.citation.volume | 17 | - |
| dc.citation.conferencePlace | CN | - |
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