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dc.contributor.authorLIM, WEON CHEOL-
dc.contributor.authorLee Ji-hye-
dc.contributor.authorLEE, YEON HEE-
dc.date.accessioned2024-01-13T02:30:45Z-
dc.date.available2024-01-13T02:30:45Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/101403-
dc.languageEnglish-
dc.subjectTOF-SIMS-
dc.subject정량분석-
dc.subject표면분석-
dc.subject금속합금-
dc.titleQuantitative Analysis of Metal Alloy by TOF-SIMS Depth Profiling-
dc.title.alternativeTOF-SIMS의 Depth Profiling을 이용한 금속의 정량분석-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation한국분석과학회, v.42, pp.68-
dc.citation.title한국분석과학회-
dc.citation.volume42-
dc.citation.startPage68-
dc.citation.endPage68-
dc.citation.conferencePlaceKO-
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