DSpace at KIST: Improvement of long tern reliabilities in Ti/MnO2/Pt resistive switching devices

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DC Field	Value	Language
dc.contributor.author	Yang Min Kyu	-
dc.contributor.author	Yoon Ho Seop	-
dc.contributor.author	고태국	-
dc.contributor.author	Lee, Jeon Kook	-
dc.date.accessioned	2024-01-13T02:31:37Z	-
dc.date.available	2024-01-13T02:31:37Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/101465	-
dc.language	English	-
dc.subject	MnO2	-
dc.subject	Ti top electrode	-
dc.subject	resistive switching	-
dc.subject	non volatile memory	-
dc.subject	retention	-
dc.subject	long term reliability	-
dc.title	Improvement of long tern reliabilities in Ti/MnO2/Pt resistive switching devices	-
dc.title.alternative	Ti/MnO2/Pt 저항변화 소자의 장기수명 향상 연구	-
dc.type	Conference	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	지식경제부 차세대메모리 개발사업 2단계 2차년도 제3회 워크샵	-
dc.citation.title	지식경제부 차세대메모리 개발사업 2단계 2차년도 제3회 워크샵	-
dc.citation.conferencePlace	KO	-

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