Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Y. I. Kim | - |
| dc.contributor.author | Eun Tae Kim | - |
| dc.contributor.author | Jeong Yong Lee | - |
| dc.contributor.author | Kim, Yong Tae | - |
| dc.date.accessioned | 2024-01-13T03:30:43Z | - |
| dc.date.available | 2024-01-13T03:30:43Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/101932 | - |
| dc.language | English | - |
| dc.title | Microstructural analysis of in doped Ge-Sb-Te thin films using high voltage electron microscopy | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | The 9th Asia-Pacific Microscopy Conference(APMC), pp.92 | - |
| dc.citation.title | The 9th Asia-Pacific Microscopy Conference(APMC) | - |
| dc.citation.startPage | 92 | - |
| dc.citation.endPage | 92 | - |
| dc.citation.conferencePlace | KO | - |
- Appears in Collections:
- KIST Conference Paper > Others
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
KIST 리포지터리는 국립중앙도서관 OAK 보급사업으로 구축되었습니다.