Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Y. I. Kim | - |
| dc.contributor.author | Eun Tae Kim | - |
| dc.contributor.author | Jeong Yong Lee | - |
| dc.contributor.author | Kim, Yong Tae | - |
| dc.date.accessioned | 2024-01-13T03:30:43Z | - |
| dc.date.available | 2024-01-13T03:30:43Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/101932 | - |
| dc.language | English | - |
| dc.title | Microstructural analysis of in doped Ge-Sb-Te thin films using high voltage electron microscopy | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | The 9th Asia-Pacific Microscopy Conference(APMC), pp.92 | - |
| dc.citation.title | The 9th Asia-Pacific Microscopy Conference(APMC) | - |
| dc.citation.startPage | 92 | - |
| dc.citation.endPage | 92 | - |
| dc.citation.conferencePlace | KO | - |
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