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dc.contributor.authorKim Chung Soo-
dc.contributor.authorEun Tae Kim-
dc.contributor.authorJeong Yong Lee-
dc.contributor.authorKim, Yong Tae-
dc.date.accessioned2024-01-13T03:30:44Z-
dc.date.available2024-01-13T03:30:44Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/101933-
dc.languageEnglish-
dc.titleIn situ transmission electron microscopy study of In-Sb-Te thin films-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationThe 9th Asia-Pacific Microscopy Conference (APMC), pp.91-
dc.citation.titleThe 9th Asia-Pacific Microscopy Conference (APMC)-
dc.citation.startPage91-
dc.citation.endPage91-
dc.citation.conferencePlaceHU-

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